Characterization of material reflectance variationthrough measurement and simulation

摘要

The characterization of material reflectance properties is important in the analysis of hyperspectral and polarizationimagery as well as accurate simulation of such images. This paper merges the results of empirical reflectance property(spectral pBRDF) measurements with detailed model based simulations. The empirical data are collected with alaboratory spectroradiometer as well as an RIT-developed spectro-polarimetric imaging goniometer. The modeling usesan adaptation of RIT's Digital Imaging and Remote Sensing Image Generation (DIRSIG) model to capture the radiativetransfer in rough surfaces with micron-scale features. Measurements and model results for several man-made materialsunder various conditions are presented.