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TEMPERATURE INFLUENCE ON DIRECTIONAL PROPERTIES OF LINEAR SLOT ARRAY

机译:线性槽阵列定向性能的温度影响

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Theoretical analysis and measurersults of temperature influence on scan angle in linear slot array working in traveling wave regime are described in the paper. Discussed slot array is used in antenna array with electronically scanned beam and beam scanning in one plane is made by frequency change. Because of physical properties of materials used in waveguide its properties, especially main beam scan angle changes significantly with temperature change. So it is important to determine scan angle for different temperatures from working temperature range of the antenna. It is rather impossible to make all required in this case measurements in antenna test range or in anechoic chamber because of requirement of temperature control of the antenna environment during test in wide range of temperatures. But it is quite simple to make measurements of waveguide's electrical properties in temperature chambers. Matching the results of this measurement with theoretical analysis of waveguide properties based on material thermal expansions coefficients allows us to achieve reliable data of beam scan angle for different temperatures. Comparison with measurements on antenna test range for different air temperatures shows good agreement.
机译:纸张描述了在行进波动中工作的线性槽阵列中温度影响的理论分析和测量。讨论的插槽阵列用于天线阵列,其具有电子扫描的光束和一个平面中的光束扫描通过频率变化进行。由于用于波导的材料的物理性质其性质,特别是主光束扫描角度随温度变化而变化显着。因此,重要的是确定来自天线的工作温度范围的不同温度的扫描角度。在这种情况下,在天线测试范围或在AneChice室中的测量中是相当不可能的,因为在宽范围的温度下测试期间天线环境的温度控制。但是,在温度室中对波导的电气性能进行测量非常简单。匹配该测量的结果,基于材料热膨胀系数的波导特性的理论分析允许我们实现不同温度的光束扫描角的可靠数据。与不同空气温度的天线测试范围的测量比较显示了良好的一致性。

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