首页> 外文会议>International Symposium on Defect and Fault-Tolerance in VLSI Systems >Power Attacks Resistance of Cryptographic S-boxes with added Error Detection Circuits
【24h】

Power Attacks Resistance of Cryptographic S-boxes with added Error Detection Circuits

机译:电力攻击加密S箱的电阻具有添加的错误检测电路

获取原文

摘要

Many side-channel attacks on implementations of cryptographic algorithms have been developed in recent years demonstrating the ease of extracting the secret key. In response, various schemes to protect cryptographic devices against such attacks have been devised and some implemented in practice. Almost all of these protection schemes target an individual side-channel attack and consequently, it is not obvious whether a scheme for protecting the device against one type of side-channel attacks may make the device more vulnerable to another type of side-channel attacks. We examine in this paper the possibility of such a negative impact for the case where fault detection circuitry is added to a device (to protect it against fault injection attacks) and analyze the resistance of the modified device to power attacks. To simplify the analysis we focus on only one component in the cryptographic device (namely, the S-box in the AES and Kasumi ciphers), and perform power attacks on the original implementation and on a modified implementation with an added parity check circuit. Our results show that the presence of the parity check circuitry has a negative impact on the resistance of the device to power analysis attacks.
机译:对许多密码算法的实现侧信道攻击已经发展在最近几年表现出的轻松提取密钥。对此,各种方案来防止这种攻击保护的加密设备已经被设计在实践中的一些实施。几乎所有这些保护方案,针对个别侧信道攻击,因此,这不是明显的保护器件免受一种类型的侧信道攻击方案是否可以使设备更容易受到另一种类型的侧信道攻击。我们在本文中的审查对于其中故障检测电路被添加到设备(以保护其免受故障注入攻击)并分析改性设备连接到电源的攻击的抵抗力的情况下,这种负面影响的可能性。为了简化,我们集中在加密设备(即,在AES和霞密码S盒)仅一个分量的分析,并在最初的实现和在具有添加的奇偶校验电路的变形实施方式进行电力的攻击。我们的结果表明,该奇偶校验电路的存在对设备到功率分析攻击的电阻的负面影响。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号