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Mn Occupations in Ga_(1-x)Mn_xN Dilute Magnetic Semiconductors Probed by X-Ray Absorption Near-Edge Structure Spectroscopy

机译:通过X射线吸收近边缘结构光谱法探测Ga_(1-x)Mn_xN稀释磁半导体的Mn占用

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X-ray absorption near-edge structure (XANES) is used to study the characteristics of different sites of Mn in the Ga1?xMnxN dilute magnetic semiconductor (DMS) with zinc-blende structure. The XANES spectra of representative Mn occupation sites (substitutional MnGa, interstitial MnI, MnGa-MnI dimer and Mn cluster) in GaN lattice are theoretically calculated and compared with experimental results. The substitutional Mn in GaN is characterized by a pre-edge peak at 2.0 eV and a post-edge multiple-scattering peak at 29.1 eV. The peaks shift in position and drop in intensity dramatically for the interstitial MnI and MnGa-MnI dimmer, and disappear completely for Mn clusters. We propose that the distinct characteristics of Mn K-edge XANES spectra for different Mn sites favor to discriminate Mn occupations in GaMnN DMS.
机译:X射线吸收近边缘结构(XANES)用于研究Ga1 xMNXN稀释磁半导体(DMS)中Mn的不同位点的特性。 GaN晶格中代表性Mn占用位点(取代Mnga,间质MNI,MNGA-MnI二聚体和Mn簇)的XANES光谱是理论上计算的,与实验结果进行比较。 GaN中的取代Mn的特征在于2.0eV的预先边缘峰值,并且在29.1eV处的边缘多散射峰。对于间质MNI和MNGA-MNI调光器,峰值在位置和强度下降的位置,并且完全消失为Mn簇。我们提出了用于不同MN位点的Mn K-Edge XANES光谱的不同特征,利用GAMNN DMS中的MN职业。

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