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An Efficient Link Controller for Test Access to IP Core-Based Embedded System Chips

机译:一种有效的链接控制器,用于测试访问IP核心嵌入式系统芯片的访问

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It becomes crucial to test and verify embedded hardware systems precisely and efficiently. For an embedded System-on-a-Chip (SoC) comprised of multiple IP cores, various design techniques have been proposed to provide diverse test access link configurations. In this paper, a Flag-based Wrapped Core Link Controller (FWCLC) is introduced to enable efficient accessibility to embedded cores as well as seamless integration of IEEE 1149.1 TAP’d cores and IEEE 1500 wrapped cores. Compared with other state-of-the-art techniques, our technique requires no modification on each core, less area overhead, and provides more diverse link configurations for design-for-debug as well as design-for-test.
机译:测试和验证嵌入式硬件系统精确有效地是至关重要的。对于由多个IP内核组成的嵌入式系统的芯片(SOC),已经提出了各种设计技术来提供各种测试访问链路配置。在本文中,引入了一种基于国旗的包装核心链路控制器(FWCLC),以实现对嵌入式核心的有效可访问性以及IEEE 1149.1 TAP'D Cores和IEEE 1500包装核心的无缝集成。与其他最先进的技术相比,我们的技术不需要对每个核心,更少的区域开销进行修改,并为设计的设计以及设计设计提供更多不同的链接配置。

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