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Time-resolved spectroscopy of excitons bound at shallow neutral donors in HVPE GaN

机译:在HVPE GaN中浅中性供体的激子弹的时间分辨光谱

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Time-resolved photoluminescence (TRPL) data for temperatures 2-150K are presented for two thick HVPE samples grown in two different laboratories. The samples both have residual O and Si shallow donor concentrations in the 10~(16)cm~(-3) range. The radiative decay time for neutral donor-bound excitons (DBEs) related to these donors is found to be about 300 ps. The decay of the DBEs at longer decay times is found to be related to feeding from the free exciton-polariton states. At elevated temperatures the decay of the DBE is very similar to the free exciton decay.
机译:对于两种不同实验室生长的两种厚的HVPE样品,提出了2-150K的温度的时间分辨的光致发光(TRPL)数据。样品均在10〜(16 )cm〜(-3)范围内具有残留的O和Si浅供体浓度。发现与这些供体相关的中性供体的激子(DBES)的辐射衰减时间被发现为约300 ps。发现DBES的衰减时间更长的衰减时间与来自自由激子 - 极性态的喂养有关。在高温下,DBE的衰减与自由激子腐烂非常相似。

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