Angular Dependence Of Critical Current Density In Ca-Doped YBCO Epitaxial Thin Films

摘要

The angular dependence of the critical current density J_(c) was analyzed in Y_(0.9)Ca_(0.1)Ba_(2)Cu_(3)O_(7-delta) epitaxial thin films grown by PLD technique on SrTiO_(3) and CeO_(2) buffered Al_(2)O_(3) substrates. The latter shows a broad peak in the J_(c) vs theta curves at (theta)(velence)0 deg (H//c), revealing a directional character of the pinning mechanisms. This feature is affected both by temperature and magnetic field intensity emerging at intermediate T and H values. The origin of the c-axis correlated pinning is discussed and compared with the previously reported studies on the directional pinning.