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Photovoltaic Characteristics of iodine-doped Amorphous Carbon Thin Films Grown by Microwave Surface-Wave Plasma CVD

机译:微波表面波等离子体CVD生长碘掺杂非晶碳薄膜的光伏特性

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This paper reports the effects of iodine (I) doping on the optical, structural and photovoltaic properties of amorphous carbon (a-C) thin-films grown on silicon and quartz substrates by microwave surface wave plasma chemical vapor deposition at low temperature ( < 100°C). For film deposition, Ar and CH_4 were used as plasma source gases. The undoped and I-doped (post deposition doping) films were characterized by UV/VIS/NIR spectroscopy, Raman spectroscopy, X-ray photoelectron spectroscopy (XPS) and current-voltage measurements. The optical band gap of the undoped film (3.4 eV) dropped to 0.9 eV after I-doping. The XPS results confirmed the successful doping of I in the a-C film. The Raman results indicated I-induced graphitization in the doped-film. The photovoltaic measurements show that the open-circuit voltage (V_(oc)) and short-circuit current density (J_(sc)) of I-doped a-C film deposited on n-type silicon substrate under light illumination (AM1.5, 100 mW/cm~2) were approximately 177 mV and 1.15 μA respectively and the fill factor was found to be 0.217. The use of a-C in photovoltaic solar cells is still in its infancy due to complicated microstructure of carbon bondings, high defect density, low photoconductivity and dificulties in controlling conduction type. Further research is underway to realize cheap, reasonably high efficiency and environmental friendly a-C based solar cells.
机译:本文报道了碘(I)掺杂对在硅和石英基板上生长的无定形碳(AC)薄膜的光学,结构和光伏性能的影响通过微波表面波等离子体化学气相沉积在低温下(<100℃ )。对于薄膜沉积,AR和CH_4用作等离子体源气体。未掺杂的和I掺杂(后沉积掺杂)膜的特征在于UV / VI / NIR光谱,拉曼光谱,X射线光电子能谱(XPS)和电流 - 电压测量。在I掺杂后,未掺杂的薄膜(3.4eV)的光带间隙降至0.9eV。 XPS结果证实了I在A-C薄膜中的成功掺杂。拉曼结果表明我诱导掺杂膜的石墨化。光伏测量表明,在光照射下沉积在n型硅衬底上的I掺杂A交流膜的开路电压(V_(OC))和短路电流密度(J_(SC))(AM1.5,100 Mw / cm〜2)分别为约177mV和1.15μA,发现填充因子为0.217。由于碳粘合剂的复杂微观结构,控制传导类型的复杂微观结构,在光伏太阳能电池中使用A-C仍处于初期。进一步的研究正在进行进一步的研究,以实现便宜,合理的高效率和环境友好的基于型太阳能电池。

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