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Effect of Heat Treatment on Structural, Optical and Morphology Properties of Tin-doped ZnO thin film

机译:热处理对锡掺杂ZnO薄膜结构,光学和形态学性能的影响

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The sol-gel method was used to obtain ZnO films doped with Sn at different annealing temperatures, 400°C, 500°C and 600°C. As a starting material, zinc acetate dehydrate was used. 2-methoxyethanol and monoethanolamine were used as the solvent and stabilizer, respectively. The dopant source was tin chloride. The atomic percentage of dopant in solution were Zn_(1-x)Sn_xO, x = 0 and 5 at.%. The proportion between dopant atoms and Zn atoms are not the same in the film as in solution. In the other cases, the dopant proportion in the film is less than that in the solution. X-ray diffraction (XRD), scanning electron microscopy (SEM), energy dispersive x-ray (EDX), UV-VIS Spectroscopy and Raman spectroscopy were used to study the structural, surface morphology, optical property of the films and the molecular bonding of the ZnO, respectively. We can conclude that the amount as well as the annealing of temperature modifies the film growth process and by consequence the microstructure and surface morphology as well as its optical properties.
机译:溶胶 - 凝胶法用于在不同退火温度下掺杂有Sn的ZnO膜,400℃,500℃和600℃。作为原料,使用乙酸锌脱水。使用2-甲氧基乙醇和单乙醇胺作为溶剂和稳定剂。掺杂剂源是氯化锡。溶液中掺杂剂的原子百分比是Zn_(1-x)Sn_XO,X = 0和5.%。掺杂剂原子和Zn原子之间的比例在薄膜中与溶液中的相同。在其他情况下,薄膜中的掺杂剂比例小于溶液中的掺杂剂。 X射线衍射(XRD),扫描电子显微镜(SEM),能量分散X射线(EDX),UV-Vis光谱和拉曼光谱研究薄膜的结构,表面形态,光学性能和分子键分别为ZnO。我们可以得出结论,温度的退火以及通过后果的微观结构和表面形态以及其光学性质的含量以及其光学性能。

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