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A New System-on-a-Chip (SOC) Technology -High Q Post Passivation Inductors

机译:新系统的芯片(SOC)技术 - 高Q后钝化电感器

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This paper presents a new SOC scheme by adding highQ(>15) inductors on top of 1C passivation layer. Affiliated with such a high Q inductor, a high performance RF CMOS chip can be achieved, which may replace some applications of GaAs chips. The highQvalue of the inductor is attributed to the large gap formed by the thick polyimide located between the inductor body and 1C passivation layer, as well as the thick metal traces of inductors. Conventional 1C front-end process technology cannot offer these advantages as it places the inductor closer to the silicon substrate, and its metal is thinner than 2μm The manufacturing cost of post-passivation inductor is also much lower than that of font-end 1C process in that the post passivation inductors can be fabricated in a more relaxed manufacturing environment Two kinds of inductor bodies, copper and gold, have been developed, respectively. At 5 GHz, the post passivation inductor demonstrated aQfactor as high as 24, which is much greater than that of the ones formed by 1C front-end process that are positioned under the passivation layer (Qvalue lower than 10). The reliability results of the new SOC scheme will be also presented.
机译:本文通过在1C钝化层顶部添加高Q(> 15)电感器来介绍一种新的SOC方案。可以实现具有这种高Q电感的隶属,可以实现高性能RF CMOS芯片,这可以代替GaAs芯片的一些应用。电感器的高度归因于位于电感器主体和1C钝化层之间的厚聚酰亚胺形成的大间隙,以及电感器的厚金属痕迹。传统的1C前端过程技术不能提供这些优点,因为它将电感器更靠近硅衬底,并且其金属薄于2μm后钝化电感器的制造成本也远低于Font-End 1C过程中的制造成本后钝化电感器可以在更轻松的制造环境中制造两种电感器体,铜和金。在5 GHz处,后钝化电感器表现为高达24的QFactor,其远远大于由位于钝化层(QValue低于10)下的1C前端工艺所形成的。还将介绍新SOC方案的可靠性结果。

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