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Surface and Morphological evolution of multilayer ultraviolet coatings developed by reactive electron beam deposition process

机译:由反应电子束沉积工艺开发的多层紫外涂层的表面和形态学

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Development of stable multilayer coatings for ultraviolet region of electromagnetic spectrum is a very challenging task due to the constraints of availability of suitable optical thin film materials. Besides the spectral performance of such devices are limited by the over all topographies evolved both during the growth and post-growth stages. In the present work, multimode scanning probe microscope has been employed to study the surface morphological evolution of ultraviolet multilayer coatings developed for various excimer laser wavelengths. These ultraviolet multilayer coatings consist of alternate layers of Gadolinium oxide and Silicon dioxide films and have been developed through reactive electron beam evaporation technique: Surface topography, force modulation and force spectroscopic measurements have been carried out on these coatings to investigate their opto-mechanical properties. These measurements have been carried out at two different occasions with a time span of 18 months, were intended to probe the multilayer stability over the period of time. Spectrophotometric measurements have also been carried out on these multilayers in order to observe their spectral stability. Both the measurements have been shown excellent correlation. Some interesting results of both multimode scanning probe microscopy and Spectrophotometric measurements and analysis have been presented in this paper.
机译:由于合适的光学薄膜材料的可用性的限制,电磁谱的紫外区域的稳定多层涂层的研制是一个非常具有挑战性的任务。除了这种装置的光谱性能,这些装置的限制在于在生长和生长后阶段的所有拓扑中出现。在本作工作中,已经采用了多模扫描探针显微镜研究为各种准分子激光波长开发的紫外线多层涂层的表面形态演化。这些紫外线多层涂层由替代氧化钆和二氧化硅膜组成,并且已经通过反应电子束蒸发技术开发:表面形貌,在这些涂层上进行了力调制和力光谱测量,以研究其光学机械性能。这些测量已经在两种不同的情况下进行了18个月的时间跨度,旨在在一段时间内探测多层稳定性。这些多层的分光光度测量也已经在这些多层上进行,以观察它们的光谱稳定性。两种测量都显示出优异的相关性。本文提出了多模扫描探针显微镜和分光光度测量和分析的一些有趣的结果。

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