Reverse currents of double layer heterojunction diodes in conditions of Shockley-Read and Auger carrier generation

摘要

The paper theoretically investigates the possibility of formation of negative differential resistance (NDR) region on the current-voltage characteristic (CVC) reverse branch of a diode with double layer heterojunction (DLHJ) in the diode's base. The NDR formation is caused by decreasing the carrier thermal generation in the narrow gap part of the base with the thickness of the order of the Debye screening length at increase of the reverse bias. It is shown that the most favourable conditions for manifestation of the NDR are realized in the case when the carrier lifetime in the base region is determined by the Auger processes.