In this work field electron emission was studied for a variety of single-wall carbon nanotube-based nanostructures (arc and HipCO nanotubes, C60 -and C70-based carbon peapods, double-wall nanotubes) in the same conditions. A comparable surface roughness for all samples was confirmed by a scanning electronic microscopy, while distribution of emission centers was visualized with a phosphorescent anode screen. We developed an original approach that improves a reliability of the field emission threshold measurements. All materials showed the emission threshold values ranging from 0.5 to 2.5 V/μm. The lowest threshold was observed for HipCO and double-wall materials that contain thinner nanotubes than other studied materials.
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