Angular correlation properties of 2D-nano-roughness-induced speckle patterns for silica-on-silicon wafers

摘要

Experimental observation of angular speckle correlations for two-dimensional nano-rough silica layers on silicon substrate are presented. The set-up makes use of a digital CCD camera to record the speckle patterns as a function of illumination and scattering angular conditions. C~((1)) correlations corresponding to the optical memory and time-reverse memory effects are reported for three different samples. C~((10)) correlation does not presently seem to be observable.