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Deformation measuring method and device using cross-correlation function between speckle patterns

机译:利用斑点图案之间的互相关函数的变形测量​​方法和装置

摘要

In a deformation measuring method and device in which an object is irradiated with a laser beam before and after deformation of the object to obtain speckle patterns, the speckle patterns thus obtained are photoelectrically converted into electrical signals, and the cross-correlation function between the speckle patterns is calculated using the electrical signals to obtain displacement of the speckle pattern on the basis of the shift of position of the extreme value of the mutual-­correlation function and to determine the amount of deformation of the object from the displacement of the speckle pattern, (1) the reference speckle pattern data for calculation of the cross-correlation function is renewed when the extreme value of the cross-correlation function is lower in level than a predetermined value or when the position of the extreme value is out of a predetermined range, or (2) the reference speckle pattern data is renewed when the extreme value of the cross-­correlation function is lower in level than a predetermined value and a calculation range for calculating the cross-correlation function is shifted when the position of the extreme value is out of a predetermined range.
机译:在变形测量方法和装置中,其中在物体变形之前和之后用激光束照射物体以获得斑点图案,将如此获得的斑点图案光电转换为电信号,并且斑点之间的互相关函数使用电信号来计算图案,以基于互相关函数的极值的位置偏移来获得斑点图案的位移,并根据斑点图案的位移来确定物体的变形量, (1)当互相关函数的极值在水平上低于预定值时或当极值的位置在预定范围之外时,更新用于计算互相关函数的参考斑点图案数据。 ,或(2)当互相关函数的极值为当极值的位置超出预定范围时,将电平低于预定值的电平和用于计算互相关函数的计算范围移动。

著录项

  • 公开/公告号EP0347912B1

    专利类型

  • 公开/公告日1993-02-24

    原文格式PDF

  • 申请/专利权人 HAMAMATSU PHOTONICS KABUSHIKI KAISHA;

    申请/专利号EP19890111389

  • 发明设计人 TAKEMORI TAMIKI;

    申请日1989-06-22

  • 分类号G01B11/16;

  • 国家 EP

  • 入库时间 2022-08-22 05:06:31

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