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Improved second harmonic two wavelength interferometer with refractive index correction without effect modulation

机译:改进了具有折射率校正的二次谐波两波长干涉仪,无需效果调制

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Refractive index fluctuations due to changing environmental conditions or due to air turbulence can significantly influence the measurement uncertainty of interferometric length measurements in air ambiance. A two wavelength interferometer is to some extend capable of measuring synchronously a path difference and the integral refractive index along this path difference. The best performance is achieved using two harmonically correlated optical fields like in a second harmonic interferometer. We developed a new type of a second harmonic two wavelength interferometer based on a double heterodyne interferometer with harmonically correlated optical wavelength. The correlation is introduced by an interferometric phase lock loop. The optical setup of the interferometer uses a double heterodyne interferometer, where the phase ratio of both interferometers is kept constant at the ratio of the optical wavelengths of both interferometers. The constant phase ratio reduces possible nonlinearities of the phase analysis. The system is capable of measuring the integral index of refraction without any effect modulation like e.g. a variation of the path difference which makes the design also applicable for absolute measuring interferometry. First experimental results will be presented.
机译:由于环境条件不变或由于空气湍流而导致的折射率波动可以显着影响空气氛围中干涉长度测量的测量不确定度。两个波长干涉仪是一些能够同步测量的路径差和沿该路径差的积分折射率。使用两个谐波干涉仪中的两个谐波相关光田实现了最佳性能。我们开发了一种基于双外差干涉仪的新型二次谐波两波长干涉仪,其具有谐波相关光波长。通过干涉阶段锁环引入相关性。干涉仪的光学设定使用双外差干涉仪,其中两种干涉仪的相相比在两个干涉仪的光波长的比率上保持恒定。恒定相比减少了相分析的可能的非线性。该系统能够测量折射的整体索引,而无需任何效果调制。路径差的变化,使设计也适用于绝对测量干涉法。第一个实验结果将出现。

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