REFRACTION INDEX MEASURING DEVICE BASED ON WHITE LIGHT INTERFEROMETER AND METHOD WHICH MEASURES INDEX OF REFRACTION ACCORDING TO WAVELENGTH OF SOLID SAMPLE, FLUID SAMPLE, BULK TYPE SAMPLE AND THIN FILM SAMPLE AND BIREFRINGENCE MATERIAL QUICKLY AND ACCURATELY

摘要

PURPOSE: A refraction index measuring device based on white light interferometer and a method are provided to measure the absolute value of the phase refraction index at the wide wavelength area fast and easy and conveniently and thoroughly by not using the complex apparatuses. ;CONSTITUTION: The refraction index measuring device based on white light interferometer includes: a light source(10); an optical signal distributor(101); a reference arm(110); a sample arm(120); an optical interferometer(100); and an optical spectrum analyzer(20). The light source outputs the optical signal of the multi frequency. The optical signal distributor distributes the optical signal inputted from the light source into 2. The reference arm receives a message one among the optical signal divided through the optical signal distributor. The sample arm receives a message the other one among the optical signal divided through the optical signal distributor and forms the stage passing through by the measurement target luminance sample and rotating the luminance sample. The interferometer optic includes the optical coupler(102). The optical coupler unites the optical signals output through the sample pal and the reference arm and interferes mutually. The optical spectrum analyzer analyzes spectrum after receiving the interfered optical signal from the interferometer optic.;COPYRIGHT KIPO 2011