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A thin film 10B sample for measuring the atom number

机译:用于测量原子序数的薄膜10B样品

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摘要

In order to measure differential cross sections of the 10B(n,α)7Li reaction induced by MeV neutrons using the forward-backward coincidence method, a thin film 10B sample was designed and the 10B atom number was determined with a reference 10B film sample. Alpha counts of the 10B(nth,α)7Li reaction from the 10B thin film and the reference sample were measured using a gridded ionization chamber and thermal neutrons, which were moderated and thermalized by paraffin from fast neutrons produced in D(d,n)3He reaction on a 4.5 MV Van de Graaff. The neutron flux was normalized by measuring the fission yield of a small 238U fission chamber.

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  • 来源
    《核技术(英文版)》 |2010年第2期|114-117|共4页
  • 作者单位

    State Key Laboratory of Nuclear Physics and Technology Institute of Heavy Ion Physics Peking University Beijing 100871 China;

  • 收录信息 中国科学引文数据库(CSCD);
  • 原文格式 PDF
  • 正文语种 chi
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