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Aliovalent Dopant Distribution in Nanocrystalline Tin Dioxide Thin Films Studied by XrayEnergy Dispersive Spectroscopy

机译：X纵梁分散光谱研究的纳米晶锡二氧化镍薄膜中的铝掺杂剂分布

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《Microscopy Society of America annual meeting》|2002年||共2页
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J. E. Dominguez; H. P. Sun; X. Q. Pan;
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中图分类观察、分析晶体结构的实验方法;
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4. Aliovalent Dopant Distribution in Nanocrystalline Tin Dioxide Thin Films Studied by XrayEnergy Dispersive Spectroscopy [C] . J. E. Dominguez, H. P. Sun, X. Q. Pan Microscopy Society of America annual meeting . 2002

机译：X纵梁分散光谱研究的纳米晶锡二氧化镍薄膜中的铝掺杂剂分布
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7. Band gap states in nanocrystalline WO3thin films studied by soft x-ray spectroscopy and optical spectrophotometry [O] . M B Johansson, P T Kristiansen, L Duda, 2016

机译：通过软X射线光谱和光学分光光度法研究的纳米晶体WO3膜中的带隙状态

Aliovalent Dopant Distribution in Nanocrystalline Tin Dioxide Thin Films Studied by XrayEnergy Dispersive Spectroscopy

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