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Laser Ablation of Thin Films on LTCC

机译:LTCC上的薄膜激光消融

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Direct Digital Manufacturing techniques such as laser ablation are proposed for the fabrication of lower cost, miniaturized, and lightweight integrated assemblies with high performance requirements. This paper investigates the laser ablation of a Ti/Cu/Pt/Au thin film metal stack on fired low temperature cofired ceramic (LTCC) surfaces using a 355 nm Nd:YAG diode pumped laser ablation system. It further investigates laser ablation applications using unfired, or 'green', LTCC materials: (1) through one layer of a laminated stack of unfired LTCC tape to a buried thick film conductor ground plane, and (2) in unfired Au thick films. The UV laser power profile and part fixturing were optimized to address defects such as LTCC microcracking, thin film adhesion failures, and redeposition of Cu and Pt. An alternate design approach to minimize ablation time was tested for efficiency in manufacture. Multichip Modules (MCM) were tested for solderability, solder leach resistance, and wire bondability. Scanning electron microscopy (SEM) as well as cross sections and microanalytical techniques were used in this study.
机译:提出了用于制造具有高性能要求的低成本,小型化和轻质集成组件的制造的直接数字制造技术。本文研究了使用355nm Nd:YAG二极管泵浦激光烧蚀系统的燃烧低温COFITED陶瓷(LTCC)表面上的Ti / Cu / Pt / Au薄膜金属堆的激光消融。它进一步研究了使用未用的或“绿色”的激光消融应用LTCC材料:(1)通过未用LTCC胶带的一层层叠叠层到掩埋的厚膜导体接地平面,(2)在未引用的Au厚膜中。优化UV激光功率分布和部件固定装置,以解决诸如LTCC微裂纹,薄膜粘附故障,铜和Pt的重新沉积的缺陷。测试最小化消融时间的替代设计方法以获得制造效率。测试多芯片模块(MCM)以进行可焊性,焊浸料和线粘合性。在本研究中使用了扫描电子显微镜(SEM)以及横截面和微量分析技术。

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