首页> 外文会议>IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems >Error Tolerance of DNA Self-Assembly by Monomer Concentration Control
【24h】

Error Tolerance of DNA Self-Assembly by Monomer Concentration Control

机译:单体浓度控制的DNA自组装误差

获取原文

摘要

This paper proposes the control of monomer concentration as a novel improvement of the kinetic Tile Assembly Model (kTAM) to reduce the error rate in DNA self-assembly. Tolerance to errors in this process is very important for manufacturing highly dense ICs; the proposed technique significantly decreases error rates (i.e. it increases error tolerance) by controlling the concentration of monomers. A stochastic analysis based on a new state model is presented. Error rates reductions of at least 10% are found by evaluating the proposed scheme comparing to a scheme with constant concentration. One of the significant advantages of the proposed scheme is that it doesn't entail an overhead such as increase in size and a slow growth, while still achieving a significant reduction in error rate.
机译:本文提出了对单体浓度的控制作为动力学瓦片组装模型(KTAM)的新改进,以降低DNA自组装中的错误率。在这个过程中对错误的耐受性对于制造高度密度的IC来说非常重要;所提出的技术通过控制单体的浓度显着降低误差率(即,增加误差容差)。提出了一种基于新状态模型的随机分析。通过评估与具有恒定浓度的方案的方案进行评估,发现至少10%的误差率降低至少10%。所提出的方案的显着优点之一是它不会导致尺寸增加和缓慢增长的开销,同时仍然实现误差率显着降低。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号