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Enhanced crosstalk fault model and methodology to generate test for arbitrary inter-core interconnect topology

机译:增强的串扰故障模型和方法生成任意核心互连拓扑的测试

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In this paper we develop a new fault model far capacitive crosstalk in inter-core interconnects. We also develop a framework to generate compact tests far interconnects with arbitrary topologies. Experimental results show that the proposed approach can significantly reduce test application time for large interconnects. We are in the process of extending the framework to interconnects that include tri-state as well as bidirectional nets.
机译:在本文中,我们在核心间互连中开发了一个新的故障模型远电容串扰。我们还开发了一个框架来生成紧凑型测试远程与任意拓扑的互连。实验结果表明,该方法可以显着降低大互连的试验时间。我们处于将框架扩展到互连的框架,包括三态以及双向网。

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