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TEST PATTERN GENERATING METHOD, TEST PATTERN GENERATING DEVICE AND FAULT MODEL GENERATING METHOD
TEST PATTERN GENERATING METHOD, TEST PATTERN GENERATING DEVICE AND FAULT MODEL GENERATING METHOD
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机译:测试模式生成方法,测试模式生成设备和故障模型生成方法
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摘要
A test pattern generating method for generating a test pattern for a circuit under test. The test pattern generating method comprises: (a) computing a plurality of signal delay values which a plurality of cells have due to different defects; (b) comparing the signal delay values and signal path delay information of a target circuit to generate a fault model; and (c) generate at least one test pattern according to the fault model.
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