Library of Modular Routines for Generating Test Patterns for Digital Circuits.

摘要

This thesis describes the development of a library of modular computer routines for the efficient and automatic generation of input patterns used to test digital integrated circuits. While solving only a small part of the testing problem, efficiently generating test patterns can lower the overall cost associated with the testing of integrated circuits. To help ensure an integrated circuit is functioning properly before it leaves the production facility, manufacturers (and their customers) rely on testing. The objectives of testing are two-fold: 1) to detect manufacturing defects, and 2) to determine the cause of any defects detected so that the manufacturing can be perfected. (KR)