首页> 外文会议>international symposium on silicon materials science and technology >Growth technology for 200mm antimony heavily doped silicon single crystals
【24h】

Growth technology for 200mm antimony heavily doped silicon single crystals

机译:200mm锑的生长技术重掺杂硅单晶

获取原文

摘要

This paper investigated crystal growth process of 200 mm heavily antimony doped silicon crystals. 22" hot zone with 90-100kg charge sizes was used. Heat shield configuration was optimized. New doping tool was designed for vapor phase method to add antimony into the melt. The effects of doping temperature and pressure on doping time were studied. Special attentions were paid to growth parameters, especially the effect of pressure on crystal resistivity profile. Crystal with resistivity less than 0.02 Ωcm was produced.
机译:本文研究了200毫米重锑掺杂硅晶体的晶体生长过程。 22“使用90-100kg电荷尺寸的热区。优化了热屏蔽配置。设计了新的掺杂工具,用于将锑添加到熔体中。研究了掺杂温度和压力对掺杂时间的影响。特别关注支付给增长参数,尤其是压力对晶体电阻率曲线的影响。产生电阻率小于0.02Ωcm的晶体。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号