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A new approach to the growth of cubic GaN films using an AlN/GaN ordered alloy as a buffer layer

机译:使用Aln / GaN有序合金作为缓冲层的立方GaN薄膜生长的新方法

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Cubic GaN films on GaAs (100) were successfully grown using a newly introduced AlN/GaN ordered alloy (OA) and plasma-assisted molecular beam epitaxy. The epilayer quality was obtained by using a (AlN){sub}1(GaN){sub}9 OA buffer layer (the numbers represent the number of monolayers). Dominant cubic GaN growth was confirmed by in-situ RHEED observation, photoluminescence (14K) and X-ray diffraction measurements.
机译:GaAs(100)上的立方GaN薄膜使用新引入的Aln / GaN有序合金(OA)和等离子体辅助分子束外延成功生长。通过使用(ALN){Sub} 1(GaN){Sub} 9 OA缓冲层(该数字表示单层数量)获得的脱落质量。通过原位Rheed观察,光致发光(14K)和X射线衍射测量确认了显性立方GaN生长。

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