首页> 外文会议>IEEE/SEMI Advanced Semiconductor Manufacturing Conference >Abstract: non-contact wafer handling using high-intensity ultrasonics
【24h】

Abstract: non-contact wafer handling using high-intensity ultrasonics

机译:摘要:使用高强度超声波处理非接触式晶圆处理

获取原文
获取外文期刊封面目录资料

摘要

Increasing requirements placed on the handling of parts in semiconductor fabrication necessitate the development of new innovative methods to handle as well wafers as fragile and surface-sensitive substrates. In order to avoid the inherent disadvantages of tactile handling, it makes sense to manipulate wafers or substrates without physical contact. This is where the technology of acoustic levitation offers itself as a suitable approach. Basically two physical effects can be utilized: While work pieces can be positioned and manipulated within a standing wave pattern, also the application of the principle of near field levitation makes it possible to design non-tactile handling systems which both will be presented in this paper.
机译:增加了在半导体制造中的部件处理方面的要求需要开发新的创新方法,以处理晶圆和表面敏感的基材。为了避免触觉处理的固有缺点,操纵晶片或基板而没有物理接触是有意义的。这是声学悬浮技术提供自己作为合适的方法。基本上可以使用两种物理效果:虽然工作件可以定位和操纵在驻波图案中,但是应用近场悬浮的原理的应用使得可以设计两者将在本文中呈现的非触觉处理系统。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号