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Epitaxial growth of an MgO buffer layer and electrode layer on Si for Pb(Zr,Ti)O/sub 3/ by PLD

机译:用于PB(Zr,Ti)O / Sub 3 / Si的MgO缓冲层和电极层的外延生长

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摘要

Thin films of MgO were grown on Si[100] substrates as a buffer layer for the epitaxial growth of films of Pb(Zr,Ti)O/sub 3/. A layer of Ir or Pt was also grown on MgO/Si as a bottom electrode layer by pulsed laser deposition. In situ reflection high-energy electron diffraction and an X-ray pole figure confirmed the epitaxial relationship between the film of MgO and the Si[100] substrate, as well as between the layer of Ir or Pt and MgO. The surface and cross-sectional morphologies of films were evaluated by atomic force microscopy and scanning electron microscopy, respectively. The Ir and Pt electrode layers grown on MgO/Si had smooth surfaces good crystallinity. PZT films were also successfully grown epitaxially on the Ir/MgO/Si and Pt/MgO/Si by metal-organic chemical vapor deposition.
机译:MgO的薄膜在Si [100]基板上生长为缓冲层,用于外延生长PB(Zr,Ti)O / Sub 3 /。通过脉冲激光沉积也将在MgO / Si中生长一层IR或Pt作为底部电极层。原位反射高能电子衍射和X射线极值证实了MgO和Si [100]衬底的膜和IR或PT和MgO之间的外延关系。通过原子力显微镜和扫描电子显微镜评估薄膜的表面和横截面形态。在MgO / Si上生长的IR和Pt电极层具有光滑的表面良好的结晶度。通过金属 - 有机化学气相沉积,PZT薄膜也成功地在IR / MgO / Si和Pt / MgO / Si上外延生长。

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