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Switching properties of the Pb{sub}0.9La{sub}0.1TiO{sub}3 thin film

机译:Pb {sub} 0.9la {sub} 0.1tio {sub} 3薄膜的切换属性

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Switching properties of the Pb{sub}0.9La{sub}0.1TiO{sub}3 thin film have been measured. As the external input pulse voltage increases from 2 to 5V, the switching time decreases from 0.49 to 0.12μs. The activation energy (E{sub}a) is obtained as 209kV/cm from the relation between the switching time and the applied pulse voltage. The switched charge densities at 5V obtained from the hysteresis loop and the polarization switching are 11.69 and 13.02μC/cm{sup}2, respectively, which agree relatively well with each other and show a difference of 10%. As the top electrode area increases from 3.14×10{sup}4 to 5.03×10{sup}4cm{sup}2, the switching time increases from 0.12 to 1.88μs. As the load resistance increases from 50Ω to 3.3kΩ, the switching time increases from 0.12μs to 9.7μs. These switching characteristics indicate that Pb{sub}0.9La{sub}0.1TiO{sub}3 thin film can be well applied in nonvolatile memory devices.
机译:已经测量了Pb {sub} 0.9la {sub} 0.1tio {sub} 3薄膜的切换属性。由于外部输入脉冲电压从2到5V增加,切换时间从0.49降至0.12μs。从切换时间与施加的脉冲电压之间的关系获得激活能量(E {Sub} A)。从滞后回路和偏振切换获得的5V处的开关电荷密度分别是11.69和13.02μc/ cm {sup} 2,这与彼此相比相对较好,并且显示出10%的差异。由于顶部电极区域从3.14×10 {sup} 4增加到5.03×10 {sup} 4cm {sup} 2,因此切换时间从0.12增加到1.88μs。随着负载电阻从50Ω增加到3.3kΩ,切换时间从0.12μs增加到9.7μs。这些切换特性表明PB {sub} 0.9la {sub} 0.1tio {sub} 3薄膜可以很好地应用于非易失性存储器件。

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