首页> 外文会议>Asian Test Symposium >False-path removal using delay fault simulation
【24h】

False-path removal using delay fault simulation

机译:使用延迟故障仿真拆除假路径

获取原文

摘要

Some false paths are caused by redundant stuck-at faults. Removal of those stuck-at faults automatically eliminates such false paths from the circuit. However, there are other false paths that are not associated with any redundant stuck-at fault. All links of such a false path are shared with other testable paths. We focus on the elimination of this type of false paths. We use a nonenumerative path delay fault simulator, which duplicates selected gates to separate the detected and undetected path delay faults. The expanded circuit may contain new redundant stuck-at faults, corresponding to those undetected paths that are false. This happens because in the expanded circuit some new links have only false paths passing through them. Such links become the sites for redundant stuck-at faults. Removal of these redundant faults eliminates false paths. The quality of the result may depend on the coverage of testable paths by the vectors that are simulated. Since a non-enumerative path delay simulation and an implication-based redundancy removal technique are used, the present procedure of false-path elimination can be applied to very large circuits.
机译:一些虚假路径是由冗余卡在故障引起的。删除粘性故障自动消除来自电路的这种错误路径。然而,还有其他错误路径与任何冗余粘附故障无关。这种错误路径的所有链接都与其他可测试路径共享。我们专注于消除这种类型的假路径。我们使用非更高的路径延迟故障模拟器,该故障模拟器重复所选门,以分离检测到的未检测到的路径延迟故障。扩展电路可能包含新的冗余卡在故障,对应于那些虚假的未检测到的路径。发生这种情况是因为在扩展的电路中,一些新的链接只有虚假的路径通过它们。此类链接成为冗余卡在故障中的网站。删除这些冗余故障消除了假路径。结果的质量可以取决于模拟的载体的可测试路径的覆盖范围。由于使用非枚举路径延迟仿真和基于含义的冗余去除技术,因此可以将本发明的假路消除过程应用于非常大的电路。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号