首页> 外国专利> QUALITY EVALUATION METHOD AND GENERATION METHOD FOR DELAY FAULT INSPECTING SERIES, DELAY FAULT SIMULATION METHOD AND DELAY FAULT INSPECTING METHOD

QUALITY EVALUATION METHOD AND GENERATION METHOD FOR DELAY FAULT INSPECTING SERIES, DELAY FAULT SIMULATION METHOD AND DELAY FAULT INSPECTING METHOD

机译:延迟故障检查系列的质量评估方法和生成方法,延迟故障模拟方法和延迟故障检查方法

摘要

PROBLEM TO BE SOLVED: To provide a quality evaluation method for delay fault inspecting series which can precisely evaluate the quality of delay fault inspecting series by taking a design delay value of a signal route which defines a delay fault into consideration.;SOLUTION: The quality evaluation method for delay fault inspecting series excludes a delay fault which has a delay value lower than a predetermined design delay value out of the objects of the delay faults. The number of the remaining delay faults is used as a reference standard. An object to be compared is the number of delay faults which are detected by the quality evaluation method for delay fault inspecting series. By using a default detection ratio, which is the ratio of the object to be compared to the reference standard, quality of delay fault inspecting series is evaluated.;COPYRIGHT: (C)2004,JPO&NCIPI
机译:解决的问题:提供一种用于延迟故障检查序列的质量评估方法,该方法可以通过考虑定义延迟故障的信号路径的设计延迟值来精确评估延迟故障检查序列的质量。延迟故障检查系列的评估方法从延迟故障的对象中排除延迟值低于预定设计延迟值的延迟故障。剩余延迟故障的数量用作参考标准。要比较的对象是通过延迟故障检查系列的质量评估方法检测到的延迟故障的数量。通过使用默认检测率(即要比较的对象与参考标准的比率)来评估延迟故障检查序列的质量。; COPYRIGHT:(C)2004,JPO&NCIPI

著录项

  • 公开/公告号JP2004251895A

    专利类型

  • 公开/公告日2004-09-09

    原文格式PDF

  • 申请/专利权人 MATSUSHITA ELECTRIC IND CO LTD;

    申请/专利号JP20040018603

  • 发明设计人 TAKEOKA SADAMI;OTA MITSUHO;

    申请日2004-01-27

  • 分类号G01R31/28;G01R31/319;G06F17/50;

  • 国家 JP

  • 入库时间 2022-08-21 23:29:55

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