Photorefractive multiple quantum well device at 1064 nm and its application to adaptive vibration measurement

摘要

We have fabricated photorefractive InGaAs/GaAs multiple quantum wells operating at a wavelength of 1064 nm and have characterized its photorefractive properties in the Franz-Keldysh geometry. A maximum gain coefficient of 200 cm~(-1) and a maximum four-wave mixing diffraction efficiency of 0.07% are obtained at an applied field of 15 kV/cm. Adaptive vibration measurement in a two-wave mixing configuration has also been demonstrated. The noise equivalent surface displacement of our measurement system is estimated at about 1.5Xl0~(-6) nm(W/Hz)~(1/2).