首页> 外文期刊>Optics Communications: A Journal Devoted to the Rapid Publication of Short Contributions in the Field of Optics and Interaction of Light with Matter >Simultaneous determination of the index and absorption gratings in multiple quantum well photorefractive devices designed for laser ultrasonic sensor
【24h】

Simultaneous determination of the index and absorption gratings in multiple quantum well photorefractive devices designed for laser ultrasonic sensor

机译:同时确定用于激光超声传感器的多量子阱光折变器件中的折射率和吸收光栅

获取原文
获取原文并翻译 | 示例
           

摘要

A method to determine complex amplitudes of index and absorption gratings in photorefractive multiple quantum wells is presented. Usually to evaluate these parameters, spectral measurement of absorption change due to the applied field over a wide wavelength range is required and the index change is calculated through the Kramers-Kronig's relationship. In our method, only a set of measured data for a photorefractive two-wave mixing set-up with small sinusoidal phase modulation for fixed wavelength is needed. This is thus well adapted to in situ characterization of systems that operate at a fixed wavelength. Real and imaginary part of the gains owing to the index and the absorption gratings are calculated from the output signals of the system. We apply this method to our photorefractive multiple quantum well devices operating at 1064 nm, and obtain consistent results.
机译:提出了一种确定光折射多量子阱中折射率和吸收光栅复振幅的方法。通常,为了评估这些参数,需要对由于在宽波长范围内施加的电场而引起的吸收变化进行光谱测量,并通过Kramers-Kronig关系计算折射率变化。在我们的方法中,对于固定波长的小正弦相位调制的光折光两波混合设置,仅需要一组测量数据。因此,这非常适合于以固定波长工作的系统的原位表征。从该系统的输出信号计算出由于折射率和吸收光栅引起的增益的实部和虚部。我们将此方法应用于在1064 nm下工作的光折射多量子阱器件,并获得一致的结果。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号