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Investigation of Single Asperity Microcutting Using an Atomic Force Microscope

机译:用原子力显微镜调查单根粗糙微电子

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摘要

Based on the geometrical features of the AFM (Atomic Force Microscope) diamond tip as well as the interaction existed between the diamond tip and the machined material, a theoretical model regarding single asperity cutting has been put forward. The experiments were conducted on various materials including Al-alloy, single crystal germanium and silicon with different normal loads and cutting speed. On the basis of the theoretical analysis verified with the experimental results, a study of cutting process on nano-scale in terms of cutting force and the material removal mechanism was conducted.
机译:基于AFM(原子力显微镜)金刚石尖端的几何特征以及金刚石尖端和加工材料之间存在的相互作用,提出了关于单根粗糙切割的理论模型。实验在各种材料上进行,包括铝合金,单晶锗和硅,具有不同的正常载荷和切割速度。在用实验结果证实的理论分析的基础上,对切割力和材料去除机理进行了纳米级切削过程的研究。

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