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Test generation for crosstalk-induced delay in integrated circuits

机译:集成电路串扰引起的延迟试验

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Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This paper shows how crosstalk coupling between lines can affect thepropagation delay of signals in integrated circuits. A model is presented to evaluate the effect of parasitic coupling crosstalk. Conditions for the creation of the worst-case coupling and propagation of a delayed signal are presented. A test patterngeneration algorithm utilizing the above conditions is presented and applied to several example circuits.
机译:由于技术缩放和时钟频率增加,由于噪声效应导致的问题导致设计/调试工作的增加和电路性能的降低。本文显示了线路之间的串扰耦合如何影响集成电路中信号的主张延迟。提出了一种模型来评估寄生偶联串扰的影响。提出了创建最坏情况耦合和延迟信号传播的条件。提出了利用上述条件的测试图案化算法并应用于几个示例电路。

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