The influence of the substrate temperature during the pulse laser deposition on the YBCO thin films reviled by A.F.M.

摘要

The results obtained by Atomic Force Microscopy (AFM) characterisation of high temperature superconducting (HTcS) YBCO thin films, Pulse Laser Deposited (PLD) on heated LaAlO{sub}3 substrate, are presented, An excimer KrF laser beam was used forthe thin film PLD (ablation) in reactive vacuum. The analysed thin films were grown on the same substrate which, because of the glue, was at different thermal conditions. It was found that the film with just a bit lower substrate temperature has notcompletely switched to the orthorhombic structure and the electrical characteristics of the two thin films species result significantly different.