Large-area amorphous silicon TFT-based X-ray image sensors for medical imaging and non destructure testing

摘要

Latge-format digital x-ray image sensors are a recent developme t in the field of medical imaging and non-destructive testing. Such image sensors have become practical through the emergence of large-area, amorphous Silicon (a-Si) TFT and photodiode technologies (1.2). This paper will review the fundamental requirements for such x-ray image sensors, and discuss some of the device requirements for TFTs and photodiodes which serve as the basic components in each pixel.