首页> 外文会议>International symposium on compound semiconductors >Far IR impurity photoconductivity in strained MQW Ge/GeSi heterostructures
【24h】

Far IR impurity photoconductivity in strained MQW Ge/GeSi heterostructures

机译:应变MQW Ge / gesi异质结构中的远红外杂质光电导性

获取原文

摘要

Far infrared photocondoctivity ( lambda chemical bounds 100-600 3muE m) in strained MQW Ge/GE_(1-x)Si_x heterostructures was investigated for the first time. In both boron-doped and undoped quantum wells spectral features associated with confined acceptors were revealed. In the undoped sample the broad ong wavelength photoconductivity band associated with shallow A~+ states in quantum wells was discovered in additions to the residual neutral acceptor A~o photoconductivity. In the magnetic fields the photoconductivity band is tuned to the high frequency region. The peak sensitivity o f the impurity photoresistor is estimated to be S chemical bounds 10~4 V/W.
机译:第一次研究了应变MQW Ge / Ge_(1-x)Si_x异质结构中的远红外光阴性(Lambda化学界100-600 3米)。在硼掺杂和未掺杂的量子阱中,揭示了与密闭受体相关的谱特征。在未掺杂的样品中,除了残余中性受体A〜O光电导性中,还发现了与量子孔中的浅A〜+状态相关的宽的ONG波长光电导带。在磁场中,光电导带被调谐到高频区域。峰灵敏度O F估计杂质光致抗蚀剂估计是S化学界限10〜4 v / w。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号