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Effect of growth parameters on the grain boundary morphology of YBa_2Cu_3O_(7-δ) on step edge (001) LaAlO_3 substrates

机译:生长参数对步进边缘(001)LAALO_3基板上YBA_2CU_3O_(7-δ)晶界形态的影响

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The grain boundary morphology in on-axis magnetron sputtered YBa_2Cu_3O_(7-δ)(YBCO) films obtained at patterned step edges on (001) LaAlO_3 substrate have been studied by scanning and transmission electron microscopy. The grain boundaries have been compared to the grain boundaries obtained in laser deposited YBCO on similar substrates. The sputtered YBCO film nucleated and grew in a more complex way compared to the laser ablated YBCO film.
机译:通过扫描和透射电子显微镜研究了在图案化的步骤边缘上获得的轴上磁控溅射YBA_2CU_3O_(7-Δ)(YBCO)膜的晶界形态。将晶界与在类似底物上的激光沉积的YBCO中获得的晶界进行比较。与激光烧蚀的YBCO薄膜相比,溅射的YBCO膜成愈合并以更复杂的方式增长。

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