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Electron-beam-activated diamond switch experiments

机译:电子束激活的金刚石开关实验

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electron beam activated diamond switches have been constructed and operated. In an initial set of experiments the electron source consisted of a LaB$-6$/ photocathode illuminated by approximately 15 nanosecond pulses of 248 nm light from a KrF laser. The photocathode could be biased at voltage of 10 - 80 kV. The type IIa diamond wafer was 12 microns thick with top and bottom electrodes consisting of Ti/Pt/Au sputtered metallizations (unannealed). Limited by surface flashover across a 12 micron broken edge of the diamond wafer, pulses with a peak power at the kilowatt level into 50 ohms were generated. The output pulse duration was set by the electron beam duration or the round trip time in the charged transmission line, whichever was shorter. Measurement of the output pulse rise time was limited by the diagnostic oscilloscope resolution but was less than one nanosecond. It was observed that the output pulse amplitude reached the expected value only when the bombarding electron beam voltage was sufficiently large that carrier pairs were generated throughout the thickness of the diamond sample.
机译:电子束激活的金刚石开关已经构造和操作。在一组初始实验中,电子源由-6 $ /光阴离子的实验室组成,由来自KRF激光器的大约15纳秒脉冲照射。光电阴极可以在10-80kV的电压下偏置。 IIA型金刚晶晶片12微米厚,具有由Ti / Pt / Au溅射的金属化(未经发烧)组成的顶部和底部电极。通过表面闪光灯的表面闪光灯限制为钻石晶片的12微米破碎的边缘,产生千瓦水​​位峰值功率的脉冲成50欧姆。输出脉冲持续时间由带电传输线中的电子束持续时间或往返时间设置,以较短。测量输出脉冲上升时间受诊断示波器分辨率的限制,但小于一个纳秒。观察到,当轰击电子束电压足够大时,输出脉冲幅度达到预期值,即在金刚石样品的厚度厚度产生载体对时。

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