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Solder Bump on Copper Stud (SBC) Method of Forming the Solder Joint in Flip Chip

机译:铜螺柱(SBC)焊接方法的焊料凸点在倒装芯片中形成焊点的方法

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There are several processes in growing solder bumps in a wafer intended for Flipchip applications. To mention a few are "Electroplated", "Ball Placed" and "Screen-printed" bumps. Upon Flipchip Attach, some manufacturing assemblies require a solder dispensing process on the leadframe to complete the interconnection between the bumps and the leadframe substrate, while others re-melt the bump on the chip to directly solder onto the substrate. For small-pitch bumping, i.e. <150μm, with several number of = 150μm-sized bumps, solder dispensing on the leadframe substrate prior to Flipchip Attach is a major source of yield and reliability problem on the product if the dispensing results to non-uniform volume for the solder dots, not withstanding the productivity loss during dispensing due to mandatory vision system monitors to ensure completeness and volume consistency of solder dispensed on the leadframe. It is the reason why some assemblies are trying to find ways to mitigate or eliminate these limitations. On the other hand, directly re-melting the bumps to form the joint is a faster process, but has its share of disadvantages in maintaining the stand-off height after reflow, which results to poor performance during Temperature and Power cycling tests. The Solder Bump on Copper stud (SBC) method defined in this paper resolved the problems mentioned and is a better solution to the manufacturability of assemblies requiring flip chip attach. This paper outlines a new method of forming a solder joint between a metal substrate and the bumps attached to the silicon in flip chip applications by solder bump on copper stud (SBC) process. This new method makes use of copper stud bumping technology coupled with solder screen-printing on wafer-level to pre-form the bumps on the silicon, This is a cost-effective alternative to electroplated bumps. The process eliminates solder dispensing process during flip chip assembly to form the final interconnection between substrate and silicon. The target applications are those that require stand-off control after flip chip attach for better reliability performance and maintain a highly conductive path for products requiring very low Rds(on) applications. Another merit of the SBC process is for applications where leadframes require deep downset or step-down and screen-printing is not an option. The process also addresses the low productivity of the solder dispensing process, consequently decreasing the overall product cost as a result of the improved equipment UPH.
机译:在用于Flipchip应用的晶片中的生长焊料凸块有几个过程。提到一些“电镀”,“球放置”和“屏幕印刷”凸块。在Flipchip附接时,一些制造组件在引线框架上需要焊料分配过程,以完成凸块和引线框架基板之间的互连,而其他制造组件在凸块和引线框架之间完成互连,而其他制造组件在芯片上重新熔化到直接焊接到基板上的凸起。对于小间距凸起,即<150μm,具有几个=150μm大小的凸块,在Flipchip附着之前在引线框架上分配在引线框架上是产品的主要来源,如果分配结果不均匀,则产品的可靠性问题由于强制性视觉系统监测器,焊点的体积,而不是在分配过程中的生产率损失,以确保在引线框架上分配的焊料的完整性和体积稠度。这就是为什么有些集装公司试图找到减轻或消除这些限制的方法的原因。另一方面,直接重新熔化凸块以形成关节的过程是更快的过程,但其缺点在于在回流后保持脱扣高度,这导致温度和功率循环测试期间的性能不佳。本文中定义的铜螺柱(SBC)方法上的焊料凸点解决了所提到的问题,并且是需要倒装芯片附着的组件的可制造性的更好的解决方案。本文概述了在铜柱(SBC)工艺上的焊料凸块在倒装芯片应用中,在金属基板和附着在硅的芯片之间形成焊点的新方法。这种新方法利用铜螺柱凸块技术与晶圆水平上的焊接丝网印刷相结合,以预先形成硅上的凸块,这是电镀凸块的经济有效替代方案。该过程消除了倒装芯片组件期间的焊料分配过程,以形成基板和硅之间的最终互连。目标应用是在倒装芯片附加后需要脱扣控制的那些,以便更好的可靠性性能,并维持需要非常低RDS(ON)应用的产品的高导电路径。 SBC进程的另一个优点是用于引导帧需要深度缩小或降压和屏幕打印的应用程序不是一个选项。该过程还解决了焊料分配过程的低生产率,因此由于改进的设备UPH而降低了整体产品成本。

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