On synthesizing and identifying stuck-open testable CMOS combinational circuits

摘要

It is shown that a class of CMOS circuits is a testable realization and static CMOS circuits synthesized by some existing synthesis systems belong to this class. A more 'direct' solution is proposed to the problem of computing robust test-pairs for stuck-open faults by defining a new six-valued logic. This in turn gives a solution to the problem of identifying stuck-open testable circuits.