首页> 外文会议>Indium Phosphide and Related Materials, 1992., Fourth International Conference on >Analysis of InP/InGaAs single and double heterostructure bipolartransistors for simultaneous high speed and high breakdownoperation
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Analysis of InP/InGaAs single and double heterostructure bipolartransistors for simultaneous high speed and high breakdownoperation

机译:InP / InGaAs单和双异质结构双极分析同时高速和高击穿的晶体管操作

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摘要

The authors present InP/InGaAs HBT (heterojunction bipolartransistor) characteristics with different collector materials anddoping profiles in view of high breakdown operation and possibly highspeed characteristics. The breakdown and speed characteristics ofInP/InGaAs HBTs were analyzed by drift-diffusion and Monte Carlomodeling, respectively. Important criteria for the speed-power tradeoffswere established and very satisfactory performance was found in gradeddouble HBTs
机译:作者介绍了InP / InGaAs HBT(异质结双极) 晶体管)的特性与不同的集电极材料和 考虑到高击穿操作和可能很高的掺杂分布 速度特性。的故障和速度特性 通过漂移扩散和蒙特卡洛分析了InP / InGaAs HBT 建模。速度-功率折衷的重要标准 已建立,并且在分级中发现了非常令人满意的性能 双重HBT

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