A quality inspection system based on low cost machine vision is presented for online quality inspection of electroplated micrometer-scale diamond wire. Instead of using a costly high-speed camera to detect moving micrometer-scale diamond particles, we adopt a general speed microscopy camera with a mechanical motion compensation module to reduce the blur effects of relative high-speed moving particles. Connected components labeling (CCL) algorithm is applied to counting and classification of diamond particles based on a special camera calibration procedure. The system is of capable to give statistical properties based on the above techniques, and experimental results validate the performance.
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