Process monitoring has been used in laser processing since 1980`s. Nevertheless, there are only afew commercially available monitoring systems at the moment for additive manufacturing R&Dpurposes. One reason for this small-scale use of monitoring in additive manufacturing industry mightbe that additive manufacturing is a relatively modern manufacturing technology when compared to theconventional ones. This study aims to the spattering analysis system development for detectingspatters from DMLS process. It was noticed that spatter monitoring has strong potential in industrialapplications to reduce the process development time and understanding better the processphenomena. Better understanding of process phenomena provides competitive advantage for processdevelopers to study what is the current mode in process, conduction, keyhole or deep keyhole. Inmonitoring of AM the interest has shifted closer to the online monitoring of the process. It is possible toachieve better part quality more cost-efficiently and optimize the quality control during the process.
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