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Void formation in flip-chip solder bumps. I

机译:倒装芯片焊料凸点中的空隙形成。一世

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Void formation in solder bumps occurs due to the formation andcoagulation of gas bubbles from the combustion of flux during the solderreflow process. The formation of such voids can result in the failure ofsolder joints under the application of load. This study aims atdetermining the factors which affect the formation and growth of thesevoids. It consists of evaluating numerous cross-sections of solderbumps, as well as the numerical modeling of the flow and bubble dynamicswithin the solder bump during the solder reflow process. The crosssections reveal several cases in which a large void is formed within thesolder bump. Generally, in the absence of such a void, a large number ofsmaller bubbles accumulate at the top of the joint, and often result incrack propagation through them. A simplified, two-dimensional numericalmodel to simulate the motion and coalescence of bubbles in a solder bumphas been developed. A recirculative flow within the melt region isassumed. This recirculation is caused by the temperature differentialbetween the exterior and interior boundaries of the melt region. Aheat-transfer analysis predicts the movement of the melt front duringreflow. It is hoped that this model, along with a study of joint crosssections, will lend some insight into the factors that affect theformation and distribution of voids within solder bumps
机译:焊料凸点中的空隙形成是由于形成和 焊料中助焊剂燃烧引起的气泡凝结 回流过程。此类空隙的形成可能会导致 施加焊点载荷下。这项研究的目的是 确定影响这些因素形成和生长的因素 虚空。它包括评估焊料的许多横截面 颠簸,以及流动和气泡动力学的数值模型 在回流焊过程中会在焊锡凸块内产生腐蚀。十字 这些部分揭示了几种情况,其中在 焊锡凸点。通常,在没有这种空隙的情况下,大量的 较小的气泡积聚在关节顶部,并经常导致 裂纹通过它们传播。简化的二维数值 模型,模拟焊料凸块中气泡的运动和聚结 已经被开发出来。熔体区域内的再循环流为 假定。这种再循环是由温差引起的 在熔化区域的外部和内部边界之间。一种 传热分析预测熔体前沿在运动过程中的运动 回流。希望该模型以及对联合交叉的研究 部分,将有助于您深入了解影响 焊料凸点内空隙的形成和分布

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