首页> 外文会议>Electronic Components and Technology Conference, 2001. Proceedings., 51st >Wide area vertical expansion (WAVETM) package design forhigh speed application: reliability and performance
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Wide area vertical expansion (WAVETM) package design forhigh speed application: reliability and performance

机译:广域垂直扩展(WAVE TM )包装设计高速应用:可靠性和性能

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A two metal flex-based WAVE package has been developed to replacefour metal rigid based PBGA package. High board-level reliability wasthe primary motivation for this project and an equivalent electricalperformance was a challenging target. All the package dimensions weremaintained the same as the reference package to allow directreplacement. As a result of the one-year-long development program, therequired reliability and performance goals were met successfully. Thispaper mainly describes the WAVE package design for reliability andperformance. Optimal lead design is the most important step for reliablepackage development. The WAVE geometry model (WAVEGM) was developed toanalyze the lead type, lead orientation, bump height, and injection liftheight. The 2-metal flex tape was chosen to replace the original 4-metalrigid substrate due to its thinner dielectric layer, lower dielectricconstant and improved trace/space design capability. The electricalperformance was verified by both simulation and actual measurements of atest device
机译:已经开发了两种基于金属挠性的WAVE封装来替代 四种基于金属的刚性PBGA封装。高板级可靠性原为 该项目的主要动机和等效的电气 性能是一个具有挑战性的目标。所有包装尺寸均为 保持与参考包装相同,以允许直接 替换。由于为期一年的开发计划, 成功满足了所需的可靠性和性能目标。这 论文主要介绍了WAVE封装设计的可靠性和 表现。最佳的引线设计是确保可靠性的最重要步骤 包开发。 WAVE几何模型(WAVEGM)被开发为 分析引线类型,引线方向,凸点高度和注入提升 高度。选择了2种金属的柔性胶带来代替原来的4种金属 刚性基底,因为其介电层更薄,介电常数更低 不断改进的跟踪/空间设计能力。电气 性能通过仿真和实际测量来验证 测试装置

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