The measurement of space charge location in insulating materialsis necessary to know the residual electric field inside thick samples.So we have studied conduction phenomena and electric behaviour of thesematerials. The Thermal Step (T.S.) technique has been already used tomeasure the remaining electric field and space charge in polymers slabsin the thickness range 0.5 mm to 20 mm. In this work, we have extendedthis method to thin films. We have increased the speed of step and theacquisition. We present the results on 12 μm polypropylene films. Theapplications concern power capacitors and interface contact problems(AL/PP)
展开▼