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Enhanced Signal-to-Noise Ratio of Ge/Gei-xSnX/Ge based Multiple Quantum Well Heterojunction Phototransistor for SWIR Photodetection

机译:基于Ge / Gei -x Sn X / Ge的增强型多量子阱异质结光电晶体管的信噪比,用于SWIR光检测

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We have studied noise characteristics and signal-to-noise ratio (SNR) of n-Ge/p-Ge1-xSnx-Ge Heterojunction Transistor (HPT) with multiple quantum well (MQW) inserted in the base and different base-width for efficient detection at 1.55 μm . The MQW inserted in the base significantly improves SNR in the high-frequency region, leading to efficient detection in the fiber-optic telecommunication windows. The results show that SNR is not only dependent on the frequency, but also on the base-width and number of quantum wells (QWs). The estimated result shows that SNR of > 61dB up to 100 GHz can be achieved, which ensures the operation of the device in the high-frequency range and low-noise detector.
机译:我们研究了n-Ge / p-Ge的噪声特性和信噪比(SNR) 1-x x / n-Ge异质结晶体管(HPT),其基极中插入了多个量子阱(MQW),基极宽度不同,可以在1.55μm处进行有效检测。插入底座中的MQW可以显着提高高频区域的SNR,从而可以在光纤电信窗口中进行有效检测。结果表明,SNR不仅取决于频率,而且还取决于量子阱(QW)的基本宽度和数量。估计结果表明,在100 GHz时可以达到> 61dB的SNR,从而确保了该器件在高频范围和低噪声检测器中的运行。

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