首页> 外文会议> >Bonding strength of Cu-to-Cu joints using Cu cold spray deposition by an oxidation and reduction process for power device package
【24h】

Bonding strength of Cu-to-Cu joints using Cu cold spray deposition by an oxidation and reduction process for power device package

机译:功率器件封装的氧化还原工艺铜冷喷涂沉积铜-铜接头的结合强度

获取原文

摘要

Reliable die-attach bonding is critical for high temperature electronic packaging. A Cu-to-Cu bonding was attempted by using an in stiu nanocrystallized surface on commerical microscale Cu cold spray deposition without using organic solvents. During sintering at 300 °C, Cu2O nano particles were formed on the surface of the cold spray deposition and then were reduced into Cu nano particles by formic acid. The shear strength reaches 20.7 MPa under applied pressure of 5 MPa and was increased with an increase of applied pressure. The formation of nanoparticles lead to a much higher shear strength compared to the joint fabricated by using microscale Cu particles. Cu2O would be further oxidized at higher temperature transferring into CuO and consequently CuO would be firstly reduced to Cu2O gradually. Subsequently, Cu2O can be reduced into Cu finally. Controlling the oxidation temperature could achieve Cu-to-Cu bonding quickly. An economical approach to implement Cu-to-Cu bonding was established.
机译:可靠的芯片连接对高温电子包装至关重要。通过在商业微观Cu冷喷雾沉积上使用在STIU纳米晶的表面上,尝试Cu-TO-Cu键合而不使用有机溶剂。在烧结300°C时,Cu 2 在冷喷雾沉积的表面上形成纳米颗粒,然后通过甲酸将其还原成Cu纳米颗粒。施用压力在5MPa的施加压力下达到20.7MPa,随着施加压力的增加而增加。与通过使用微金属颗粒颗粒制造的接头相比,纳米颗粒的形成导致更高的剪切强度。铜 2 O将在较高温度下进一步氧化成CuO,因此CuO将首先降低到Cu 2 o逐渐。随后,CU 2 o最终可以减少到Cu中。控制氧化温度可以快速实现Cu-TO-Cu键合。建立了实施Cu-〜Cu键合的经济方法。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号